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Books and further publications

Books

B. Beckhoff, B. Kanngießer, N. Langhoff, R.Wedell, H. Wolff (eds.),

“Handbook of Practical X-Ray Fluorescence Analysis”,

Springer-Verlag ISBN 3-540-28603-9, (2006)


B. Kanngießer und M. Haschke, Kapitel “Micro X-Ray Fluorescence Spectroscopy” in

“Handbook of Practical X-Ray Fluorescence Analysis”,

Springer-Verlag ISBN 3-540-28603-9, (2006)


Further publications

B. Kanngießer

„From 1D to 3D Micro X-ray Fluorescence Spectroscopy- Fundamentals and Applications“,

Habilitationsschrift, Technical University of Berlin (2004).


A. Denker, O. Hahn, S. Merkel, M. Radtke, B. Kanngießer, W. Malzer, S. Röhrs, I. Reiche, H.Stege, „Röntgenanalytik für Kunstwerke und Kulturgüter“, Nachrichten aus der Chemie 02, 118-123, (2005).


B. Kanngießer, W. Malzer, I. Reiche,

“Micro-XRF goes 3D: X-ray Insights into Indian Mughal Paintings“,

BESSY-Highlights 2002 – Scientific Highlights (2003).


B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, G. Pepponi, C. Streli, P. Wobrauschek, T. Ehmann, L. Fabry, C. Mantler, S. Pahlke, B. Kanngießer, W. Malzer,

“Ultra-Trace Analysis of Light Elements and Speciation of Minute Organic Contaminants on Silicon Wafer Surfaces by Means of TXRF in Combination with NEXAFS“, Electrochemical Society Proceedings ‘Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes’, 2003-03, 120-128 (2003).


A. G. Kochur, V. L. Sukhorukov, V. F. Demekhin, C. Gerth, B. Kanngießer, and P. Zimmermann,

“Cascading decay of inner-shell vacancies” in: 19th International Conference

on X-Rays and Inner-Shell Processes. Ed. by A. Biancony, A. Marcelli and

N.I. Saini. AIP Conference Proceedings: Melville, New York, v. CP652, p.256-266, (2003).


B. Kanngießer,

“The Use of Multilayer in the Energy Dispersive X-Ray Fluorescence Analysis of Light Elements with a Thin Window Si(Li) Detector“, PhD thesis, University of Bremen (1995).


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