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- XRF system for the analysis of thin layers
- © AG Kanngießer
The instrument offers the possibility for qualitative and quantitative elemental investigation with XRF of unknown samples. The quantification of layered samples is possible.
research project: elemental imaging with (confocal) micro-XRF 
|Rh microfocus X-ray tube, 50 kV, 600
collimators, 5 filters|
|optical microscope with motorized table for